prBAS EN IEC 60749-37:2026

Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer


Опште информације
Статус:Пројекат
Број страница:45
Метода усвајања:Proglašavanje
Језик:engleski,francuski
Издање:2.
Датум реализације:04.11.2025
Предвиђени датум наредне фазе:19.11.2025
Технички комитет:BAS/TC 64, ВС2 - Електротехничка стандардизација
ICS:
31.080.01, Пoлупрoвoднички урeђajи oпћeнитo

Абстракт
<!-- NEW! -->IEC 60749-37:2022 is available as <a href="https://webstore.iec.ch/publication/79480">IEC 60749-37:2022 RLV</a> which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.</br></br>IEC 60749-37:2022 provides a test method that is intended to evaluate and compare drop performance of surface mount electronic components for handheld electronic product applications in an accelerated test environment, where excessive flexure of a circuit board causes product failure. The purpose is to standardize the test board and test methodology to provide a reproducible assessment of the drop test performance of surface-mounted components while producing the same failure modes normally observed during product level test. This edition includes the following significant technical changes with respect to the previous edition: - correction of a previous technical error concerning test conditions; - updates to reflect improvements in technology.

Животни циклус
...

Изворни документ и степен усаглашености
EN IEC 60749-37:2022, идентичан
IEC 60749-37:2022, идентичан

Веза са BAS стандардима

Радни материјал

Сaмo члaнoви тeхничкoг кoмитeтa имajу приступ рaднoм мaтeриjaлу. Укoликo стe члaн, мoлимo вac приjaвитe сe сa вaшим нaлoгoм и дoбићeтe приступ дoкумeнтимa. Пријавите се