BAS EN 60749-5:2019

IEC 60749-5:2017(E) provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a)   correction of an error in an equation; b)   inclusion of notes for guidance; c)   clarification of the applicability of test conditions.