BAS EN 60749-5:2019
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
General Information
Status: Published
No. of pages: 12
Language: English
Edition: 2.
Adoption method: Endorsment
Publication date: 15.02.2019
Technical committee:
...
Abstract
IEC 60749-5:2017(E) provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition:
a) correction of an error in an equation;
b) inclusion of notes for guidance;
c) clarification of the applicability of test conditions.
Lifecycle
...
Original document and degree of correspondence
- EN 60749-5:2017, identical
- IEC 60749-5:2017, identical