BAS EN 60749-5:2011
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
General Information
Status: Withdrawn
No. of pages: 19
Language: English, French
Edition: 1.
Adoption method: Endorsment
Publication date: 31.10.2011
Technical committee:
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Abstract
Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
Lifecycle
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Original document and degree of correspondence
- EN 60749-5:2003, identical
- IEC 60749-5:2003, identical