prBAS EN IEC 60269-3:2026 Low-voltage fuses - Part 3: Supplementary requirements for fuses for operation by unskilled persons (fuses mainly for household and similar applications) - Examples of standardized systems of fuses A to F
00.99
BAS/TC 18
23.10.2025
02.11.2025
prBAS EN IEC 60269-4:2026 Low-voltage fuses - Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices
00.99
BAS/TC 18
23.10.2025
02.11.2025
prBAS EN IEC 60270:2026 High-voltage test techniques - Charge-based measurement of partial discharges
00.99
BAS/TC 8
30.10.2025
10.11.2025
prBAS EN IEC 60404-18:2026 Magnetic materials - Part 18: Permanent magnet (magnetically hard) materials - Methods of measurement of the magnetic properties in an open magnetic circuit using a superconducting magnet
00.99
BAS/TC 18
23.10.2025
02.11.2025
prBAS EN IEC 60664-1/A1:2026 Insulation coordination for equipment within low-voltage supply systems - Part 1: Principles, requirements and tests
00.99
BAS/TC 8
30.10.2025
10.11.2025
prBAS EN IEC 60688:2026 Electrical measuring transducers for converting AC and DC electrical quantities to analogue or digital signals
prBAS EN IEC 60749-10:2026 Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly
00.99
BAS/TC 64
04.11.2025
19.11.2025
prBAS EN IEC 60749-28:2026 Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
00.99
BAS/TC 64
04.11.2025
19.11.2025
prBAS EN IEC 60749-34-1:2026 Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module
00.99
BAS/TC 64
04.11.2025
19.11.2025
prBAS EN IEC 60749-37:2026 Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
00.99
BAS/TC 64
04.11.2025
19.11.2025
prBAS EN IEC 60749-39:2026 Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
00.99
BAS/TC 64
04.11.2025
19.11.2025
prBAS EN IEC 60749-5:2026 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test