Showing 921-940 of 1,885 items.
Standard referenceStage codeBAS/TCReal dateForseen date for next stage code
  
prBAS EN IEC 60122-2:2026
Quartz crystal units of assessed quality - Part 2: Guidelines for the use
00.99BAS/TC 1023.10.202505.11.2025
prBAS EN IEC 60127-9:2026
Miniature fuses - Part 9: Miniature fuse-links for special applications with partial-range breaking capacity
00.99BAS/TC 1823.10.202502.11.2025
prBAS EN IEC 60255-26:2026
Measuring relays and protection equipment - Part 26: Electromagnetic compatibility requirements
00.99BAS/TC 1823.10.202502.11.2025
prBAS EN IEC 60255-27:2026
Measuring relays and protection equipment - Part 27: Product safety requirements
00.99BAS/TC 1823.10.202502.11.2025
prBAS EN IEC 60269-1:2026
Low-voltage fuses - Part 1: General requirements
00.99BAS/TC 1823.10.202502.11.2025
prBAS EN IEC 60269-3:2026
Low-voltage fuses - Part 3: Supplementary requirements for fuses for operation by unskilled persons (fuses mainly for household and similar applications) - Examples of standardized systems of fuses A to F
00.99BAS/TC 1823.10.202502.11.2025
prBAS EN IEC 60269-4:2026
Low-voltage fuses - Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices
00.99BAS/TC 1823.10.202502.11.2025
prBAS EN IEC 60270:2026
High-voltage test techniques - Charge-based measurement of partial discharges
00.99BAS/TC 830.10.202510.11.2025
prBAS EN IEC 60404-18:2026
Magnetic materials - Part 18: Permanent magnet (magnetically hard) materials - Methods of measurement of the magnetic properties in an open magnetic circuit using a superconducting magnet
00.99BAS/TC 1823.10.202502.11.2025
prBAS EN IEC 60664-1/A1:2026
Insulation coordination for equipment within low-voltage supply systems - Part 1: Principles, requirements and tests
00.99BAS/TC 830.10.202510.11.2025
prBAS EN IEC 60688:2026
Electrical measuring transducers for converting AC and DC electrical quantities to analogue or digital signals
00.99BAS/TC 1023.10.202505.11.2025
prBAS EN IEC 60747-16-7:2026
Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators
00.99BAS/TC 6404.11.202519.11.2025
prBAS EN IEC 60747-16-8:2026
Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters
00.99BAS/TC 6404.11.202519.11.2025
prBAS EN IEC 60747-16-9:2026
Semiconductor devices - Part 16-9: Microwave integrated circuits - Phase shifters
00.99BAS/TC 6404.11.202519.11.2025
prBAS EN IEC 60749-10:2026
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly
00.99BAS/TC 6404.11.202519.11.2025
prBAS EN IEC 60749-28:2026
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
00.99BAS/TC 6404.11.202519.11.2025
prBAS EN IEC 60749-34-1:2026
Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module
00.99BAS/TC 6404.11.202519.11.2025
prBAS EN IEC 60749-37:2026
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
00.99BAS/TC 6404.11.202519.11.2025
prBAS EN IEC 60749-39:2026
Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
00.99BAS/TC 6404.11.202519.11.2025
prBAS EN IEC 60749-5:2026
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
00.99BAS/TC 6404.11.202519.11.2025