Showing 861-880 of 2,316 items.
Standard referenceStage codeBAS/TCReal dateForseen date for next stage code
  
nsBAS EN IEC 60730-2-23:2026
Automatic electrical controls - Part 2-23: Particular requirements for electrical sensors and sensing elements
40.20BAS/TC 5114.05.202610.07.2026
nsBAS EN IEC 60730-2-6:2026
Automatic electrical controls - Part 2-6: Particular requirements for automatic electrical pressure sensing controls including mechanical requirements
40.20BAS/TC 5114.05.202610.07.2026
nsBAS EN IEC 60730-2-8:2026
Automatic electrical controls - Part 2-8: Particular requirements for electrically operated water valves, including mechanical requirements
40.20BAS/TC 5114.05.202610.07.2026
nsBAS EN IEC 60747-16-7:2026
Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60747-16-8:2026
Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60747-16-9:2026
Semiconductor devices - Part 16-9: Microwave integrated circuits - Phase shifters
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-10:2026
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-28:2026
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-34-1:2026
Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-37:2026
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-39:2026
Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-5:2026
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60851-1/A1:2026
Winding wires - Test methods - Part 1: General
40.20BAS/TC 3020.04.202619.06.2026
nsBAS EN IEC 60879/A1:2026
Comfort fans and regulators for household and similar purposes - Methods for measuring performance
40.20BAS/TC 5721.05.202621.07.2026
nsBAS EN IEC 60898-3/A1:2026
Electrical accessories - Circuit-breakers for overcurrent protection for household and similar installations - Part 3: Circuit-breakers for DC operation
40.20BAS/TC 3020.04.202619.06.2026
nsBAS EN IEC 60898-3/A11:2026
Electrical accessories - Circuit-breakers for overcurrent protection for household and similar installations - Part 3: Circuit-breakers for DC operation
40.20BAS/TC 3020.04.202619.06.2026
nsBAS EN IEC 60898-3:2026
Electrical accessories - Circuit-breakers for overcurrent protection for household and similar installations - Part 3: Circuit-breakers for DC operation
40.20BAS/TC 3020.04.202619.06.2026
nsBAS EN IEC 60931-1:2026
Shunt power capacitors of the non-self-healing type for AC systems having a rated voltage up to and including 1 000 V - Part 1: General
40.20BAS/TC 3020.04.202619.06.2026
nsBAS EN IEC 60931-2:2026
Shunt power capacitors of the non-self-healing type for AC systems having a rated voltage up to and including 1 000 V - Part 2: Ageing test and destruction test
40.20BAS/TC 3020.04.202619.06.2026
nsBAS EN IEC 60947-2:2026
Low-voltage switchgear and controlgear - Part 2: Circuit-breakers
40.20BAS/TC 5222.05.202622.07.2026