prBAS ISO 17862:2025
Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
General information
Status:Project
Number of pages:22
Adoption method:Korice
Language:engleski
Edition:2.
Realization date:07.11.2024
Forseen date for next stage code:19.11.2024
Technical committee:BAS/TC 49, Chemical engineering, laboratory equipment and cosmetics
ICS:
71.040.40, Chemical analysis
Abstract
This document specifies a method for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale in single ion counting time-of-flight (TOF) secondary ion mass spectrometers using a test based on isotopic ratios in spectra from poly(tetrafluoroethylene) (PTFE). It also includes a method to correct for intensity nonlinearity arising from intensity lost from a microchannel plate (MCP) or scintillator and photomultiplier followed by a time-to-digital converter (TDC) detection system caused by secondary ions arriving during its dead-time. The correction can increase the intensity range for 95 % linearity by a factor of up to more than 50 so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction formulae have been shown to be valid.
Lifecycle
...
Original document and degree of correspondence
ISO 17862:2022, identical
Relation to BAS standards
Work material
Only members of the technical committee have access to work material. If you are a members of this technical committee you need to login to view the documents. Login