Showing 101-120 of 2,559 items.
Standard referenceStage codeBAS/TCReal dateForseen date for next stage code
  
nsBAS EN IEC 60127-9:2026
Miniature fuses - Part 9: Miniature fuse-links for special applications with partial-range breaking capacity
40.20BAS/TC 1825.03.202625.05.2026
nsBAS EN IEC 60255-26:2026
Measuring relays and protection equipment - Part 26: Electromagnetic compatibility requirements
40.20BAS/TC 1825.03.202625.05.2026
nsBAS EN IEC 60255-27:2026
Measuring relays and protection equipment - Part 27: Product safety requirements
40.20BAS/TC 1825.03.202625.05.2026
nsBAS EN IEC 60269-1:2026
Low-voltage fuses - Part 1: General requirements
40.20BAS/TC 1825.03.202625.05.2026
nsBAS EN IEC 60269-3:2026
Low-voltage fuses - Part 3: Supplementary requirements for fuses for operation by unskilled persons (fuses mainly for household and similar applications) - Examples of standardized systems of fuses A to F
40.20BAS/TC 1825.03.202625.05.2026
nsBAS EN IEC 60269-4:2026
Low-voltage fuses - Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices
40.20BAS/TC 1825.03.202625.05.2026
nsBAS EN IEC 60269-7:2026
Low-voltage fuses - Part 7: Supplementary Requirements for fuse-links for the protection of batteries and battery systems
40.20BAS/TC 1825.03.202625.05.2026
nsBAS EN IEC 60404-18:2026
Magnetic materials - Part 18: Permanent magnet (magnetically hard) materials - Methods of measurement of the magnetic properties in an open magnetic circuit using a superconducting magnet
40.20BAS/TC 1825.03.202625.05.2026
nsBAS EN IEC 60747-16-7:2026
Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60747-16-8:2026
Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60747-16-9:2026
Semiconductor devices - Part 16-9: Microwave integrated circuits - Phase shifters
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-10:2026
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-28:2026
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-34-1:2026
Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-37:2026
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-39:2026
Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-5:2026
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 61031:2026
Nuclear facilities - Instrumentation and control systems - Design, location and application criteria for installed area gamma radiation dose rate monitoring equipment for use during normal operation and anticipated operational occurrences
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 61098:2026
Radiation protection instrumentation - Installed personnel surface contamination monitors
40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 61124:2026
Reliability testing - Compliance tests for constant failure rate and constant failure intensity
40.20BAS/TC 6426.02.202626.04.2026