Showing 81-100 of 2,552 items.
Standard referenceStage codeBAS/TCReal dateForseen date for next stage code
  
nrdBAS EN ISO 505:2026
Conveyor belts - Method for the determination of the tear propagation resistance of textile conveyor belts 		20.99BAS/TC 2909.12.202530.03.2026
nrdBAS EN ISO 6143:2026
Gas analysis - Comparison methods for determining and checking the composition of calibration gas mixtures 		20.99BAS/TC 3109.12.202530.03.2026
nrdBAS EN ISO 703:2026
Conveyor belts - Transverse flexibility (troughability) - Test method 		20.99BAS/TC 2909.12.202530.03.2026
nsBAS EN IEC 60747-16-7:2026
Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators		40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60747-16-8:2026
Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters		40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60747-16-9:2026
Semiconductor devices - Part 16-9: Microwave integrated circuits - Phase shifters		40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-10:2026
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly		40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-28:2026
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level		40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-34-1:2026
Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module		40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-37:2026
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer		40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-39:2026
Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components		40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-5:2026
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test		40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 61031:2026
Nuclear facilities - Instrumentation and control systems - Design, location and application criteria for installed area gamma radiation dose rate monitoring equipment for use during normal operation and anticipated operational occurrences		40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 61098:2026
Radiation protection instrumentation - Installed personnel surface contamination monitors		40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 61124:2026
Reliability testing - Compliance tests for constant failure rate and constant failure intensity		40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 61162-1:2026
Maritime navigation and radiocommunication equipment and systems - Digital interfaces - Part 1: Single talker and multiple listeners		40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 61162-2:2026
Maritime navigation and radiocommunication equipment and systems - Digital interfaces - Part 2: Single talker and multiple listeners, high-speed transmission		40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 61162-450:2026
Maritime navigation and radiocommunication equipment and systems - Digital interfaces - Part 450: Multiple talkers and multiple listeners - Ethernet interconnection		40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 61188-6-3:2026
Circuit boards and circuit board assemblies - Design and use - Part 6-3: Land pattern design - Description of land pattern for through hole components (THT)		40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 61189-2-501:2026
Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 2-501: Test methods for materials for interconnection structures - Measurement of resilience strength and resilience strength retention factor of flexible dielectric materials		40.20BAS/TC 6426.02.202626.04.2026