Showing 281-300 of 2,558 items.
Standard referenceStage codeBAS/TCReal dateForseen date for next stage code
  
nsBAS EN IEC 60268-7:2026
Sound system equipment - Part 7: Headphones and earphones		40.20BAS/TC 507.04.202607.06.2026
nsBAS EN IEC 60269-1:2026
Low-voltage fuses - Part 1: General requirements		40.20BAS/TC 1825.03.202625.05.2026
nsBAS EN IEC 60269-3:2026
Low-voltage fuses - Part 3: Supplementary requirements for fuses for operation by unskilled persons (fuses mainly for household and similar applications) - Examples of standardized systems of fuses A to F		40.20BAS/TC 1825.03.202625.05.2026
nsBAS EN IEC 60269-4:2026
Low-voltage fuses - Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices		40.20BAS/TC 1825.03.202625.05.2026
nsBAS EN IEC 60269-7:2026
Low-voltage fuses - Part 7: Supplementary Requirements for fuse-links for the protection of batteries and battery systems		40.20BAS/TC 1825.03.202625.05.2026
nsBAS EN IEC 60404-18:2026
Magnetic materials - Part 18: Permanent magnet (magnetically hard) materials - Methods of measurement of the magnetic properties in an open magnetic circuit using a superconducting magnet		40.20BAS/TC 1825.03.202625.05.2026
nsBAS EN IEC 60747-16-7:2026
Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators		40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60747-16-8:2026
Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters		40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60747-16-9:2026
Semiconductor devices - Part 16-9: Microwave integrated circuits - Phase shifters		40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-10:2026
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly		40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-28:2026
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level		40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-34-1:2026
Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module		40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-37:2026
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer		40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-39:2026
Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components		40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60749-5:2026
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test		40.20BAS/TC 6426.02.202626.04.2026
nsBAS EN IEC 60793-1-40:2026
Optical fibres - Part 1-40: Attenuation measurement methods		40.20BAS/TC 507.04.202607.06.2026
nsBAS EN IEC 60793-2-50:2026
Optical fibres - Part 2-50: Product specifications - Sectional specification for class B single-mode fibres		40.20BAS/TC 507.04.202607.06.2026
nsBAS EN IEC 60793-2-60:2026
Optical fibres - Part 2-60: Product specifications - Sectional specification for class C single-mode interconnection fibres		40.20BAS/TC 507.04.202607.06.2026
nsBAS EN IEC 60794-1-110:2026
Optical fibre cables - Part 1-110: Generic specification - Basic optical cable test procedures - Mechanical tests methods - Kink, Method E10		40.20BAS/TC 507.04.202607.06.2026
nsBAS EN IEC 60794-1-119:2026
Optical fibre cables - Part 1-119: Generic specification - Basic optical cable test procedures - Mechanical tests methods - Aeolian vibration, Method E19		40.20BAS/TC 507.04.202607.06.2026