BAS ISO 18118:2012
Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
General Information
Status: Withdrawn
No. of pages: 23
Language: English
Edition: 1.
Adoption method: Endorsment
Publication date: 08.05.2012
Technical committee:
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Abstract
Lifecycle
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Original document and degree of correspondence
- ISO 18118:2004, identical