prBAS EN IEC 63287-2:2026

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile

General information

Status:Project

Number of pages:34

Adoption method:Proglašavanje

Language:engleski,francuski

Edition:1.

Realization date:04.11.2025

Forseen date for next stage code:19.11.2025

Technical committee:BAS/TC 64, VS2 - Electrotechnical standardization

ICS:

31.080.01, Semiconductor devices in general

Abstract

This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.

Lifecycle

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Original document and degree of correspondence

EN IEC 63287-2:2023, identical

IEC 63287-2:2023, identical

Work material

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