prBAS ISO 18118:2025
Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
General information
Status:Project
Number of pages:26
Adoption method:Korice
Language:engleski
Edition:3.
Realization date:07.11.2024
Forseen date for next stage code:19.11.2024
Technical committee:BAS/TC 49, Chemical engineering, laboratory equipment and cosmetics
ICS:
71.040.40, Chemical analysis
Abstract
This document gives guidance on the measurement and use of experimentally-determined relative sensitivity factors for the quantitative analysis of homogeneous materials by Auger electron spectroscopy and X-ray photoelectron spectroscopy. The methods described only apply to polycrystalline and amorphous materials, as effects inherent to single-crystal samples are not addressed.
Lifecycle
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Original document and degree of correspondence
ISO 18118:2024, identical
Relation to BAS standards
Work material
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