prBAS IEC TS 63342:2025

C-Si photovoltaic (PV) modules - Light and elevated temperature induced degradation (LETID) test - Detection

General information

Status:Project

Number of pages:13

Adoption method:Proglašavanje

Language:engleski

Edition:1.

Realization date:17.12.2024

Forseen date for next stage code:23.12.2024

Technical committee:BAS/TC 56, Conventional and alternative sources of electrical energy

ICS:

27.160, Solar energy engineering

Abstract

IEC TS 63342:2022 is designed to assess the effect of light induced degradation at elevated temperatures (LETID) by application of electrical current at higher temperatures. In this document, only the current injection approach for the detection of LETID is addressed.<br /> This document does not address the B-O and Iron Boron (Fe-B) related degradation phenomena, which already occur at room temperatures under the presence of light and on much faster time scales. The proposed test procedure can reveal sample sensitivity to LETID degradation mechanisms, but it does not provide an exact measure of field observable degradation.

Lifecycle

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Original document and degree of correspondence

IEC TS 63342:2022, identical

Work material

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