prBAS ISO 23729:2025
Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
General information
Status:Project
Number of pages:19
Adoption method:Korice
Language:engleski
Edition:1.
Realization date:20.11.2024
Forseen date for next stage code:10.03.2025
Technical committee:BAS/TC 49, Chemical engineering, laboratory equipment and cosmetics
ICS:
71.040.40, Chemical analysis
Abstract
This document describes a procedure for the quantitative characterization of the probe tip of an atomic force microscope (AFM) probe and a restoration of AFM topography images dilated by finite probe size. The three-dimensional shape of the probe apex is extracted by image reconstruction using suitable reference materials. This document is applicable to the reconstruction of AFM topography images of solid material surfaces.
Lifecycle
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Original document and degree of correspondence
ISO 23729:2022, identical
Work material
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