prBAS EN IEC 63364-1:2026

Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection

General information

Status:Project

Number of pages:24

Adoption method:Proglašavanje

Language:engleski,francuski

Edition:1.

Realization date:04.11.2025

Forseen date for next stage code:19.11.2025

Technical committee:BAS/TC 64, VS2 - Electrotechnical standardization

ICS:

31.080.99, Other semiconductor devices

Abstract

This part of IEC 63364-1 provides terms, test method, and report of sound variation detection system based on IoT. It provides the evaluation method for each part of the sound variation detection system based on IoT in the block diagram, the characterization parameters, symbols, test setups and the conditions. In addition, this document defines the configuration items and criteria of standard space and firing situation for the quality evaluation measurement of sound field variation detection system with IoT.

Lifecycle

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Original document and degree of correspondence

EN IEC 63364-1:2023, identical

IEC 63364-1:2022, identical

Work material

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