Showing 1-20 of 23 items.
| Standard reference | Stage code | BAS/TC | Real date | Forseen date for next stage code |
|---|---|---|---|---|
| prBAS CEN/TR 18010:2025 Chemical disinfectants and antiseptics - Information on the preparation of spores and determination/exclusion of sporistatical activity | 00.99 | BAS/TC 49 | 07.11.2024 | 19.11.2024 |
| prBAS EN 13697:2025 Chemical disinfectants and antiseptics - Quantitative non-porous surface test for the evaluation of bactericidal and yeasticidal and/or fungicidal activity of chemical disinfectants used in food, industrial, domestic and institutional areas without mechanical action - Test method and requirements without mechanical action (phase 2, step 2) | 00.99 | BAS/TC 49 | 07.11.2024 | 19.11.2024 |
| prBAS EN 17430:2025 Chemical disinfectants and antiseptics - Hygienic handrub virucidal - Test method and requirements (phase 2/step 2) | 00.99 | BAS/TC 49 | 07.11.2024 | 19.11.2024 |
| prBAS EN 17846:2025 Chemical disinfectants and antiseptics - Quantitative test method for the evaluation of sporicidal activity against Clostridioides difficile on non-porous surfaces with mechanical action employing wipes in the medical area (4-field test) - Test method and requirements (phase 2, step 2) | 00.99 | BAS/TC 49 | 07.11.2024 | 19.11.2024 |
| prBAS ISO 14427:2025 Carbonaceous materials used in the production of aluminium — Cold and tepid ramming pastes — Preparation of unbaked test specimens and determination of apparent density after compaction | 00.99 | BAS/TC 49 | 07.11.2024 | 19.11.2024 |
| prBAS ISO 14606:2025 Surface chemical analysis — Sputter depth profiling — Optimization using layered systems as reference materials | 00.99 | BAS/TC 49 | 07.11.2024 | 19.11.2024 |
| prBAS ISO 17109:2025 Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films | 00.99 | BAS/TC 49 | 07.11.2024 | 19.11.2024 |
| prBAS ISO 17544:2025 Carbonaceous materials used in the production of aluminium — Cold and tepid ramming pastes — Determination of rammability of unbaked pastes | 00.99 | BAS/TC 49 | 07.11.2024 | 19.11.2024 |
| prBAS ISO 17862:2025 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers | 00.99 | BAS/TC 49 | 07.11.2024 | 19.11.2024 |
| prBAS ISO 17973:2025 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis | 00.99 | BAS/TC 49 | 07.11.2024 | 19.11.2024 |
| prBAS ISO 18115-1:2025 Surface chemical analysis — Vocabulary — Part 1: General terms and terms used in spectroscopy | 00.99 | BAS/TC 49 | 07.11.2024 | 19.11.2024 |
| prBAS ISO 18115-2:2025 Surface chemical analysis — Vocabulary — Part 2: Terms used in scanning-probe microscopy | 00.99 | BAS/TC 49 | 07.11.2024 | 19.11.2024 |
| prBAS ISO 18115-3:2025 Surface chemical analysis — Vocabulary — Part 3: Terms used in optical interface analysis | 00.99 | BAS/TC 49 | 07.11.2024 | 19.11.2024 |
| prBAS ISO 18118:2025 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials | 00.99 | BAS/TC 49 | 07.11.2024 | 19.11.2024 |
| prBAS ISO 20579-1:2025 Surface chemical analysis — Sample handling, preparation and mounting — Part 1: Documenting and reporting the handling of specimens prior to analysis | 00.99 | BAS/TC 49 | 07.11.2024 | 19.11.2024 |
| prBAS ISO 23124:2025 Surface chemical analysis — Measurement of lateral and axial resolutions of a Raman microscope | 00.99 | BAS/TC 49 | 07.11.2024 | 19.11.2024 |
| prBAS ISO 23170:2025 Surface chemical analysis — Depth profiling — Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering | 00.99 | BAS/TC 49 | 07.11.2024 | 19.11.2024 |
| prBAS ISO 23729:2025 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size | 00.99 | BAS/TC 49 | 07.11.2024 | 19.11.2024 |
| prBAS ISO 24417:2025 Surface chemical analysis — Analysis of metallic nanolayers on iron based substrates by glow-discharge optical-emission spectrometry | 00.99 | BAS/TC 49 | 07.11.2024 | 19.11.2024 |
| prBAS ISO 5861:2025 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments | 00.99 | BAS/TC 49 | 07.11.2024 | 19.11.2024 |