prBAS ISO 17862:2025
Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
Opšte informacije
Status:Projekt
Broj stranica:22
Metoda usvajanja:Korice
Jezik:engleski
Izdanje:2.
Datum realizacije:07.11.2024
Predviđeni datum naredne faze:19.11.2024
Tehnički komitet:BAS/TC 49, Hemijski inžinjering, laboratorijska oprema i kozmetika
ICS:
71.040.40, Hemijska analiza
Apstrakt
This document specifies a method for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale in single ion counting time-of-flight (TOF) secondary ion mass spectrometers using a test based on isotopic ratios in spectra from poly(tetrafluoroethylene) (PTFE). It also includes a method to correct for intensity nonlinearity arising from intensity lost from a microchannel plate (MCP) or scintillator and photomultiplier followed by a time-to-digital converter (TDC) detection system caused by secondary ions arriving during its dead-time. The correction can increase the intensity range for 95 % linearity by a factor of up to more than 50 so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction formulae have been shown to be valid.
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ISO 17862:2022, identičan
Veza sa BAS standardima
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